Discover Next-Level Testing with Seica’s Pilot VX and Compact SL at APEX
Seica, Inc. is excited to announce its participation in the upcoming 2025 IPC APEX EXPO, scheduled to take place March 18-20, 2025, at the Anaheim Convention Center in Anaheim, California. Visitors to Booth #3205 will experience Seica’s Pilot VX flying probe test platform and the Compact SL in-line bed-of-nails tester presented in a fully automated configuration, alongside real-time data insights powered by the Canavisia Dashboard.
Automation is now critical for optimizing manufacturing processes, and Seica remains at the forefront of delivering advanced test solutions. The integration of Seica’s platforms with the VIVA Integrated Platform (VIP™) allows a seamless combination of testing technologies to achieve maximum throughput and test coverage in the shortest possible time.
The Pilot VX, Seica’s flagship flying probe system, showcases cutting-edge mechanical architecture and motion controllers, reducing test times by up to 50%. Equipped with 12 multi-function test heads, the Pilot VX enables double-sided probing of up to 44 points simultaneously. Advanced hardware, such as a microwave-based measurement technique and unique options like the FlyPod and FlyStrain™, enhances its testing capabilities further. The FlyPod option specializes in mobile probes with up to 14 channels, while FlyStrain™ maps pressure/force topologies on devices under test.
The Compact SL is engineered to deliver maximum configurability and customization, addressing a comprehensive range of test requirements, including in-circuit, functional, and combinational testing. It supports advanced tasks such as onboard programming (OBP), combining speed and flexibility to meet the rigorous throughput demands of today’s manufacturing environments. With the latest ATE BOOSTER module, this system enhances LED testing and OBP performance while minimizing hardware resource costs.
On display will also be Seica’s DeviceClip; a universal ISP (In-System Programming) programming tool designed for programming all types of semiconductor devices (microcontrollers, serial memories, programmable logic devices) from any semiconductor manufacturer. The solution is modular and can be configured to provide up to 64 parallel, totally independent, multi-protocol ISP channels, and is provided with an embedded control panel compatible with any operating system. Its integrated high-performance microcomputer enables DeviceClip to reach the maximum programming speed of any device, and each channel within the module can be configured to support totally different targets ensuring an extremely high level of flexibility. The DeviceClip can be operated in a workbench standalone scenario or integrated into any of our test platforms, such as the Pilot VX or Compact line of testers.
