Hall 6 , Booth C-140 “Welcome to the new dimension of test, the fourth dimension”. The “new dimension” of test will be presented through several different lines of products, all designed around the common core of the enhanced VIP platform, where 3.0 generation is ready to go for the future of test, taking care of TIME,
AP Technology Week, March 10-12, 2015, Anglo Production Processes, Saxon Business Park, United Kingdom. Seica will take part to the technology week, organized by APP in March, presenting the Pilot 4DV8 flying prober and the Firefly B60 laser selective soldering. The Pilot4DV8 line represents the latest in technology in flying probe testing for both ICT, functional
On 23-24 January, the Seica Kick-off meeting took place, a biennal event with our global sales network. We wish to thank all of our partners and colleagues who attended the event.
Seica Inc. will be exhibiting our new line of flying prober, the Pilot 4D line which will be represented at the show by the Pilot 4DV8 and Pilot FX. The Pilot 4D line represents the latest in technology in flying probe testing for both ICT, functional testing and data regeneration applications. The Pilot 4DV8 will
Main Events to meet Seica during 2015 … Apex USA US 24-27 February Expoelectronica Russia 23-24 April MRO Americas US 14-16 April Nepcon Shanghai China 21-25 April New-Tech Exhibition Israel 19-20 May Nepcon Shenshen China 25-27 August SMTA US US 29-30 September Automotive Testing US 20-22 October Productronica Germany 12-15 November
During Electronica 2014 Seica has presented the new Pilot 4D FX platform, the innovation in panel testing, bridging the gap between In-circuit and Functional test.
Seica will be at Estanflux stand with Pilot V8, Compact TK and a Mini 80… come visit us! Visiti Estanflux website to learn more.
Innovation, automation and optimization: these are the three keywords underlying the new test solutions for electronic boards showcased this year by Seica in its booth at Electronica. Three, fully-automated test systems will provide a comprehensive overview of Seica’s VIP Platform, ranging from in-circuit to functional test, from flying probe test to standard, in-circuit test via
